Used, in nice condition.
The Scintag X1 Advanced Powder Diffraction System is an diffractometer designed for comprehensive material characterization. It is widely utilized in research and industrial settings to analyze crystalline structures, determine phase compositions, assess crystallinity, and evaluate thin film properties.
Key Applications:
Crystalline Phase Identification: Determines the specific phases present in a material.
Crystallinity Assessment: Evaluates the degree of crystallinity within a sample.
Crystallite Size Measurement: Estimates the size of individual crystalline regions.
Crystal Structure Determination: Elucidates the arrangement of atoms within the crystal lattice.
Thin Film Analysis: Investigates properties of thin films, including thickness and orientation.
High/Low-Temperature Powder Diffraction: Performs diffraction studies under varying temperature conditions.
Reviews
There are no reviews yet.